Capacitance-voltage measurements of mos capacitors applied to process and damage recognition /

Capacitance-voltage measurements of mos capacitors applied to process and damage recognition /

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Bibliographic Details
Main Authors:	354303 Puangkird, B., Haworth, L. I., Robertson, J. M., International Symposium on IC Technology, Systems and Applications (5th : 1993 : Singapore)
Format:
Subjects:	Capacitors Electric capacity

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