Diagnostic electron microscopy /
42
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New York : McGraw-Hill,
1982
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_version_ | 1826394853105205248 |
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author | 344047 Johannessen, Jan Vincents |
author_facet | 344047 Johannessen, Jan Vincents |
author_sort | 344047 Johannessen, Jan Vincents |
collection | OCEAN |
description | 42 |
first_indexed | 2024-03-04T22:13:52Z |
format | |
id | KOHA-OAI-TEST:194817 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-04T22:13:52Z |
publishDate | 1982 |
publisher | New York : McGraw-Hill, |
record_format | dspace |
spelling | KOHA-OAI-TEST:1948172020-12-19T17:05:30ZDiagnostic electron microscopy / 344047 Johannessen, Jan Vincents New York : McGraw-Hill,19824250PSZJBLDiagnosis, Electron microscopicURN:ISBN:007032543X |
spellingShingle | Diagnosis, Electron microscopic 344047 Johannessen, Jan Vincents Diagnostic electron microscopy / |
title | Diagnostic electron microscopy / |
title_full | Diagnostic electron microscopy / |
title_fullStr | Diagnostic electron microscopy / |
title_full_unstemmed | Diagnostic electron microscopy / |
title_short | Diagnostic electron microscopy / |
title_sort | diagnostic electron microscopy |
topic | Diagnosis, Electron microscopic |
work_keys_str_mv | AT 344047johannessenjanvincents diagnosticelectronmicroscopy |