Nanometer technology designs : high quality delay tests /
16
| Main Authors: | , |
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| Format: | |
| Language: | eng |
| Published: |
Berlin : Springer,
2008
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| Subjects: |
| _version_ | 1796686926976122880 |
|---|---|
| author | Tehranipoor, Mohammad H., 1974- Ahmed, Nisar |
| author_facet | Tehranipoor, Mohammad H., 1974- Ahmed, Nisar |
| author_sort | Tehranipoor, Mohammad H., 1974- |
| collection | OCEAN |
| description | 16 |
| first_indexed | 2024-03-04T22:48:54Z |
| format | |
| id | KOHA-OAI-TEST:206574 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-04T22:48:54Z |
| publishDate | 2008 |
| publisher | Berlin : Springer, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:2065742020-12-19T17:05:57ZNanometer technology designs : high quality delay tests / Tehranipoor, Mohammad H., 1974- Ahmed, Nisar Berlin : Springer,2008eng16PSZJBLIntegrated circuitsIntegrated circuitsNanotechnologyURN:ISBN:9780387764863 (hbk.) |
| spellingShingle | Integrated circuits Integrated circuits Nanotechnology Tehranipoor, Mohammad H., 1974- Ahmed, Nisar Nanometer technology designs : high quality delay tests / |
| title | Nanometer technology designs : high quality delay tests / |
| title_full | Nanometer technology designs : high quality delay tests / |
| title_fullStr | Nanometer technology designs : high quality delay tests / |
| title_full_unstemmed | Nanometer technology designs : high quality delay tests / |
| title_short | Nanometer technology designs : high quality delay tests / |
| title_sort | nanometer technology designs high quality delay tests |
| topic | Integrated circuits Integrated circuits Nanotechnology |
| work_keys_str_mv | AT tehranipoormohammadh1974 nanometertechnologydesignshighqualitydelaytests AT ahmednisar nanometertechnologydesignshighqualitydelaytests |