Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
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Format: | |
Language: | eng |
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Boston : Kluwer Acad. Publishers ,
2000
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author | 192499 Bushnell, Michael L. Agrawal, Vishwani D. |
author_facet | 192499 Bushnell, Michael L. Agrawal, Vishwani D. |
author_sort | 192499 Bushnell, Michael L. |
collection | OCEAN |
description | 16 |
first_indexed | 2024-03-04T23:00:01Z |
format | |
id | KOHA-OAI-TEST:210305 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-04T23:00:01Z |
publishDate | 2000 |
publisher | Boston : Kluwer Acad. Publishers , |
record_format | dspace |
spelling | KOHA-OAI-TEST:2103052020-12-19T17:06:05ZEssentials of electronic testing for digital, memory and mixed - signal VLSI circuits / 192499 Bushnell, Michael L. Agrawal, Vishwani D. Boston : Kluwer Acad. Publishers ,2000eng16PSZJBLIntegrated circuitsDigital integrated circuitsMixed signal circuitsSemiconductor storage devicesURN:ISBN:0792379918 (hbk.) |
spellingShingle | Integrated circuits Digital integrated circuits Mixed signal circuits Semiconductor storage devices 192499 Bushnell, Michael L. Agrawal, Vishwani D. Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title | Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title_full | Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title_fullStr | Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title_full_unstemmed | Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title_short | Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits / |
title_sort | essentials of electronic testing for digital memory and mixed signal vlsi circuits |
topic | Integrated circuits Digital integrated circuits Mixed signal circuits Semiconductor storage devices |
work_keys_str_mv | AT 192499bushnellmichaell essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits AT agrawalvishwanid essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits |