Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /

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Bibliographic Details
Main Authors: 192499 Bushnell, Michael L., Agrawal, Vishwani D.
Format:
Language:eng
Published: Boston : Kluwer Acad. Publishers , 2000
Subjects:
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author 192499 Bushnell, Michael L.
Agrawal, Vishwani D.
author_facet 192499 Bushnell, Michael L.
Agrawal, Vishwani D.
author_sort 192499 Bushnell, Michael L.
collection OCEAN
description 16
first_indexed 2024-03-04T23:00:01Z
format
id KOHA-OAI-TEST:210305
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-04T23:00:01Z
publishDate 2000
publisher Boston : Kluwer Acad. Publishers ,
record_format dspace
spelling KOHA-OAI-TEST:2103052020-12-19T17:06:05ZEssentials of electronic testing for digital, memory and mixed - signal VLSI circuits / 192499 Bushnell, Michael L. Agrawal, Vishwani D. Boston : Kluwer Acad. Publishers ,2000eng16PSZJBLIntegrated circuitsDigital integrated circuitsMixed signal circuitsSemiconductor storage devicesURN:ISBN:0792379918 (hbk.)
spellingShingle Integrated circuits
Digital integrated circuits
Mixed signal circuits
Semiconductor storage devices
192499 Bushnell, Michael L.
Agrawal, Vishwani D.
Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title_full Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title_fullStr Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title_full_unstemmed Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title_short Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /
title_sort essentials of electronic testing for digital memory and mixed signal vlsi circuits
topic Integrated circuits
Digital integrated circuits
Mixed signal circuits
Semiconductor storage devices
work_keys_str_mv AT 192499bushnellmichaell essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits
AT agrawalvishwanid essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits