Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /

Essentials of electronic testing for digital, memory and mixed - signal VLSI circuits /

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Bibliographic Details
Main Authors:	192499 Bushnell, Michael L., Agrawal, Vishwani D.
Format:
Language:	eng
Published:	Boston : Kluwer Acad. Publishers , 2000
Subjects:	Integrated circuits Digital integrated circuits Mixed signal circuits Semiconductor storage devices

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