Multiple-beam interferometry of surfaces and films/

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Bibliographic Details
Main Author: 200177 Tolansky, Samuel
Format:
Published: New York : Dover Publications, 1970
Subjects:
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author 200177 Tolansky, Samuel
author_facet 200177 Tolansky, Samuel
author_sort 200177 Tolansky, Samuel
collection OCEAN
description 40
first_indexed 2024-03-04T23:16:55Z
format
id KOHA-OAI-TEST:215923
institution Universiti Teknologi Malaysia - OCEAN
last_indexed 2024-03-04T23:16:55Z
publishDate 1970
publisher New York : Dover Publications,
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spelling KOHA-OAI-TEST:2159232020-12-19T17:06:20ZMultiple-beam interferometry of surfaces and films/ 200177 Tolansky, Samuel New York : Dover Publications,197040PSZJBLInterferometersSurfaces (Technology)MetallographyURN:ISBN:0486622150
spellingShingle Interferometers
Surfaces (Technology)
Metallography
200177 Tolansky, Samuel
Multiple-beam interferometry of surfaces and films/
title Multiple-beam interferometry of surfaces and films/
title_full Multiple-beam interferometry of surfaces and films/
title_fullStr Multiple-beam interferometry of surfaces and films/
title_full_unstemmed Multiple-beam interferometry of surfaces and films/
title_short Multiple-beam interferometry of surfaces and films/
title_sort multiple beam interferometry of surfaces and films
topic Interferometers
Surfaces (Technology)
Metallography
work_keys_str_mv AT 200177tolanskysamuel multiplebeaminterferometryofsurfacesandfilms