Multiple-beam interferometry of surfaces and films/
40
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New York : Dover Publications,
1970
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_version_ | 1796688831920996352 |
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author | 200177 Tolansky, Samuel |
author_facet | 200177 Tolansky, Samuel |
author_sort | 200177 Tolansky, Samuel |
collection | OCEAN |
description | 40 |
first_indexed | 2024-03-04T23:16:55Z |
format | |
id | KOHA-OAI-TEST:215923 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-04T23:16:55Z |
publishDate | 1970 |
publisher | New York : Dover Publications, |
record_format | dspace |
spelling | KOHA-OAI-TEST:2159232020-12-19T17:06:20ZMultiple-beam interferometry of surfaces and films/ 200177 Tolansky, Samuel New York : Dover Publications,197040PSZJBLInterferometersSurfaces (Technology)MetallographyURN:ISBN:0486622150 |
spellingShingle | Interferometers Surfaces (Technology) Metallography 200177 Tolansky, Samuel Multiple-beam interferometry of surfaces and films/ |
title | Multiple-beam interferometry of surfaces and films/ |
title_full | Multiple-beam interferometry of surfaces and films/ |
title_fullStr | Multiple-beam interferometry of surfaces and films/ |
title_full_unstemmed | Multiple-beam interferometry of surfaces and films/ |
title_short | Multiple-beam interferometry of surfaces and films/ |
title_sort | multiple beam interferometry of surfaces and films |
topic | Interferometers Surfaces (Technology) Metallography |
work_keys_str_mv | AT 200177tolanskysamuel multiplebeaminterferometryofsurfacesandfilms |