Proceedings of the International Conference on Defects in Semiconductors/

Proceedings of the International Conference on Defects in Semiconductors/

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Detalles Bibliográficos
Autores principales: International Conference on Defects in Semiconductors (16th : 1991 : Bethlehem, Pennsylavania), Davies, Gordon, Gary, G., Stavola, Michael
Formato:
Publicado: Zurich : Trans Tech Pub, 1992
Materias:
Semiconductors
Semiconductor doping

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