Analysis of the wavelet-based image difference algorithm for PCB inspection /

Analysis of the wavelet-based image difference algorithm for PCB inspection /

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Bibliographic Details
Main Authors:	363678 Zuwairie Ibrahim, Syed Abdul Rahman Syed Abu Bakar, Zulfakar Aspar, SICE 2002 (2002 : Osaka, Japan)
Format:
Language:	eng
Published:	Skudai : Universiti Teknologi Malaysia, 2002
Subjects:	Printed circuits Electronic circuits Image transmission Wavelets (Mathematics)

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