Detecting lies and deceit : pitfalls and opportunities /
Includes bibliographical references (p. 421-482) and index
Main Author: | |
---|---|
Format: | |
Language: | eng |
Published: |
Hoboken, NJ : John Wiley & Sons,
2008
|
Subjects: |
Includes bibliographical references (p. 421-482) and index
Main Author: | |
---|---|
Format: | |
Language: | eng |
Published: |
Hoboken, NJ : John Wiley & Sons,
2008
|
Subjects: |