Analytical threshold voltage model of nanoscale biaxial ultrathin strained-Si MOSFETs /

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Bibliographic Details
Main Authors:	Yau, Wei Heong, author, Mohammad Taghi Ahmadi, author, Razali Ismail, author, Regional Conference on Solid State Science and Technology (2009 : Pulau Pinang)
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Published:	Skudai : Universiti Teknologi Malaysia, 2009

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