Characterization analysis of a novel approach in fabrication of CMOS compatible vertical MOSFETs incorporating a dielectric pocket /

Characterization analysis of a novel approach in fabrication of CMOS compatible vertical MOSFETs incorporating a dielectric pocket /

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Dettagli Bibliografici
Autori principali:	Munawar Riyadi, author, Zul Atfyi Fauzan Mohammed Napiah, 1983-, author, Ismail Saad, author, Razali Ismail, author, IEEE International Conference on Semiconductor Electronic (2008: Johor)
Natura:
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Pubblicazione:	Skudai : Universiti Teknologi Malaysia, 2008

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