Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA /
Includes bibliographical references and author index
Main Authors: | , , , |
---|---|
Format: | |
Language: | eng |
Published: |
New York, NY : SPIE,
2005
|
Subjects: |
Summary: | Includes bibliographical references and author index |
---|