Nanoscale characterization of surfaces and interfaces /
40
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| Format: | |
| Published: |
Weinheim : VCH,
1994
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| _version_ | 1796701202357944320 |
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| author | 425757 DiNardo, N. John |
| author_facet | 425757 DiNardo, N. John |
| author_sort | 425757 DiNardo, N. John |
| collection | OCEAN |
| description | 40 |
| first_indexed | 2024-03-05T02:11:12Z |
| format | |
| id | KOHA-OAI-TEST:273946 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-05T02:11:12Z |
| publishDate | 1994 |
| publisher | Weinheim : VCH, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:2739462020-12-19T17:08:49ZNanoscale characterization of surfaces and interfaces / 425757 DiNardo, N. John Weinheim : VCH,199440PSZJBLSurfaces (Physics)Scanning tunneling microscopyNanotechnologyURN:ISBN:3527292470 |
| spellingShingle | Surfaces (Physics) Scanning tunneling microscopy Nanotechnology 425757 DiNardo, N. John Nanoscale characterization of surfaces and interfaces / |
| title | Nanoscale characterization of surfaces and interfaces / |
| title_full | Nanoscale characterization of surfaces and interfaces / |
| title_fullStr | Nanoscale characterization of surfaces and interfaces / |
| title_full_unstemmed | Nanoscale characterization of surfaces and interfaces / |
| title_short | Nanoscale characterization of surfaces and interfaces / |
| title_sort | nanoscale characterization of surfaces and interfaces |
| topic | Surfaces (Physics) Scanning tunneling microscopy Nanotechnology |
| work_keys_str_mv | AT 425757dinardonjohn nanoscalecharacterizationofsurfacesandinterfaces |