Optical methods in engineering metrology /
05
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London : Chapman & Hall,
1993
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_version_ | 1826412144814456832 |
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author | Williams, David C. |
author_facet | Williams, David C. |
author_sort | Williams, David C. |
collection | OCEAN |
description | 05 |
first_indexed | 2024-03-05T02:25:44Z |
format | |
id | KOHA-OAI-TEST:278790 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-05T02:25:44Z |
publishDate | 1993 |
publisher | London : Chapman & Hall, |
record_format | dspace |
spelling | KOHA-OAI-TEST:2787902020-12-19T17:09:00ZOptical methods in engineering metrology / Williams, David C. London : Chapman & Hall,199305PSZJBLMensurationOptical measurementsURN:ISBN:0412396408 |
spellingShingle | Mensuration Optical measurements Williams, David C. Optical methods in engineering metrology / |
title | Optical methods in engineering metrology / |
title_full | Optical methods in engineering metrology / |
title_fullStr | Optical methods in engineering metrology / |
title_full_unstemmed | Optical methods in engineering metrology / |
title_short | Optical methods in engineering metrology / |
title_sort | optical methods in engineering metrology |
topic | Mensuration Optical measurements |
work_keys_str_mv | AT williamsdavidc opticalmethodsinengineeringmetrology |