The effect of oxide thickness on current-voltage (I-V) and capacitance-voltage (C-V) characteristics of tunnel mos structures /

The effect of oxide thickness on current-voltage (I-V) and capacitance-voltage (C-V) characteristics of tunnel mos structures /

Project Paper (Sarjana Muda Sains seta Pendidikan (Fizik)) - Universiti Teknologi Malaysia, 2004

Bibliográfalaš dieđut
Váldodahkkit: 193265 Vithyaananthini Govindaraju, Yussof Wahab, supervisor, Fakulti Sains
Materiálatiipa:
Giella:eng
Almmustuhtton: 2004
Govvádus
Čoahkkáigeassu:Project Paper (Sarjana Muda Sains seta Pendidikan (Fizik)) - Universiti Teknologi Malaysia, 2004

Geahča maid