Test pattern generation for combinational multiplier interconnects /
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2008
| Principais autores: | , , |
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| Formato: | |
| Idioma: | eng |
| Publicado em: |
2008
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| Assuntos: |
| _version_ | 1826414522122895360 |
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| author | 266340 Nurul Huda Tendot Zakaria Muhammad Nadzir Marsono, supervisor Fakulti Kejuruteraan Elektrik |
| author_facet | 266340 Nurul Huda Tendot Zakaria Muhammad Nadzir Marsono, supervisor Fakulti Kejuruteraan Elektrik |
| author_sort | 266340 Nurul Huda Tendot Zakaria |
| collection | OCEAN |
| description | Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2008 |
| first_indexed | 2024-03-05T03:01:30Z |
| format | |
| id | KOHA-OAI-TEST:290722 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T03:01:30Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:2907222020-12-19T17:09:29ZTest pattern generation for combinational multiplier interconnects / 266340 Nurul Huda Tendot Zakaria Muhammad Nadzir Marsono, supervisor Fakulti Kejuruteraan Elektrik 2008engProject Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2008Includes bibliographical referencesFEELECTLMicroelectronicsDigital electronics |
| spellingShingle | Microelectronics Digital electronics 266340 Nurul Huda Tendot Zakaria Muhammad Nadzir Marsono, supervisor Fakulti Kejuruteraan Elektrik Test pattern generation for combinational multiplier interconnects / |
| title | Test pattern generation for combinational multiplier interconnects / |
| title_full | Test pattern generation for combinational multiplier interconnects / |
| title_fullStr | Test pattern generation for combinational multiplier interconnects / |
| title_full_unstemmed | Test pattern generation for combinational multiplier interconnects / |
| title_short | Test pattern generation for combinational multiplier interconnects / |
| title_sort | test pattern generation for combinational multiplier interconnects |
| topic | Microelectronics Digital electronics |
| work_keys_str_mv | AT 266340nurulhudatendotzakaria testpatterngenerationforcombinationalmultiplierinterconnects AT muhammadnadzirmarsonosupervisor testpatterngenerationforcombinationalmultiplierinterconnects AT fakultikejuruteraanelektrik testpatterngenerationforcombinationalmultiplierinterconnects |