Test pattern generation for combinational multiplier interconnects /

Test pattern generation for combinational multiplier interconnects /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2008

Bibliographic Details
Main Authors: 266340 Nurul Huda Tendot Zakaria, Muhammad Nadzir Marsono, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Language:eng
Published: 2008
Subjects:
Microelectronics
Digital electronics

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