Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /

Project paper (Bachelor of Electrical Engineering) - Universiti Teknologi Malaysia, 1995

Bibliographic Details
Main Author: 270928 Siew, Choo Soon
Format:
Published: Kuala Lumpur : UTM, 1995
Subjects:
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author 270928 Siew, Choo Soon
author_facet 270928 Siew, Choo Soon
author_sort 270928 Siew, Choo Soon
collection OCEAN
description Project paper (Bachelor of Electrical Engineering) - Universiti Teknologi Malaysia, 1995
first_indexed 2024-03-05T03:12:30Z
format
id KOHA-OAI-TEST:294361
institution Universiti Teknologi Malaysia - OCEAN
last_indexed 2024-03-05T03:12:30Z
publishDate 1995
publisher Kuala Lumpur : UTM,
record_format dspace
spelling KOHA-OAI-TEST:2943612020-12-19T17:09:39ZDegradation in palm oil based ester due to chemical structure change in event of an electrical breakdown / 270928 Siew, Choo Soon Kuala Lumpur : UTM,1995Project paper (Bachelor of Electrical Engineering) - Universiti Teknologi Malaysia, 199515PRZSLElectric insulators and insulationTerhad selama 5 tahun
spellingShingle Electric insulators and insulation
270928 Siew, Choo Soon
Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title_full Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title_fullStr Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title_full_unstemmed Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title_short Degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown /
title_sort degradation in palm oil based ester due to chemical structure change in event of an electrical breakdown
topic Electric insulators and insulation
work_keys_str_mv AT 270928siewchoosoon degradationinpalmoilbasedesterduetochemicalstructurechangeineventofanelectricalbreakdown