Substrate warpage analysis during solder reflow process /

Thesis (Sarjana Kejuruteraan (Mekanikal)) - Universiti Teknologi Malaysia, 2004

Bibliographic Details
Main Author: 384464 Beh, Keh Shin
Format:
Language:eng
Published: Skudai : Universiti Teknologi Malaysia, 2004
Subjects:
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author 384464 Beh, Keh Shin
author_facet 384464 Beh, Keh Shin
author_sort 384464 Beh, Keh Shin
collection OCEAN
description Thesis (Sarjana Kejuruteraan (Mekanikal)) - Universiti Teknologi Malaysia, 2004
first_indexed 2024-03-05T03:14:20Z
format
id KOHA-OAI-TEST:294977
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T03:14:20Z
publishDate 2004
publisher Skudai : Universiti Teknologi Malaysia,
record_format dspace
spelling KOHA-OAI-TEST:2949772020-12-19T17:09:41ZSubstrate warpage analysis during solder reflow process / 384464 Beh, Keh Shin Skudai : Universiti Teknologi Malaysia,2004engThesis (Sarjana Kejuruteraan (Mekanikal)) - Universiti Teknologi Malaysia, 2004Negative microfilm : MFL 014676 ra16FEMELMicroelectronic packagingRestricted until 16th March 2006
spellingShingle Microelectronic packaging
384464 Beh, Keh Shin
Substrate warpage analysis during solder reflow process /
title Substrate warpage analysis during solder reflow process /
title_full Substrate warpage analysis during solder reflow process /
title_fullStr Substrate warpage analysis during solder reflow process /
title_full_unstemmed Substrate warpage analysis during solder reflow process /
title_short Substrate warpage analysis during solder reflow process /
title_sort substrate warpage analysis during solder reflow process
topic Microelectronic packaging
work_keys_str_mv AT 384464behkehshin substratewarpageanalysisduringsolderreflowprocess