ESD : failure mechanisms and models /

16

Bibliographic Details
Main Author: 389397 Voldman, Steven H.
Format:
Language:eng
Published: UK : Wiley, 2009
Subjects:
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author 389397 Voldman, Steven H.
author_facet 389397 Voldman, Steven H.
author_sort 389397 Voldman, Steven H.
collection OCEAN
description 16
first_indexed 2024-03-05T03:15:41Z
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institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T03:15:41Z
publishDate 2009
publisher UK : Wiley,
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spelling KOHA-OAI-TEST:2954302020-12-19T17:09:42ZESD : failure mechanisms and models / 389397 Voldman, Steven H. UK : Wiley,2009eng16PSZJBLSemiconductorsIntegrated circuitsIntegrated circuitsURN:ISBN:9780470511374 (hbk.)
spellingShingle Semiconductors
Integrated circuits
Integrated circuits
389397 Voldman, Steven H.
ESD : failure mechanisms and models /
title ESD : failure mechanisms and models /
title_full ESD : failure mechanisms and models /
title_fullStr ESD : failure mechanisms and models /
title_full_unstemmed ESD : failure mechanisms and models /
title_short ESD : failure mechanisms and models /
title_sort esd failure mechanisms and models
topic Semiconductors
Integrated circuits
Integrated circuits
work_keys_str_mv AT 389397voldmanstevenh esdfailuremechanismsandmodels