ESD : failure mechanisms and models /
16
Main Author: | |
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Format: | |
Language: | eng |
Published: |
UK : Wiley,
2009
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Subjects: |
_version_ | 1796705870972715008 |
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author | 389397 Voldman, Steven H. |
author_facet | 389397 Voldman, Steven H. |
author_sort | 389397 Voldman, Steven H. |
collection | OCEAN |
description | 16 |
first_indexed | 2024-03-05T03:15:41Z |
format | |
id | KOHA-OAI-TEST:295430 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T03:15:41Z |
publishDate | 2009 |
publisher | UK : Wiley, |
record_format | dspace |
spelling | KOHA-OAI-TEST:2954302020-12-19T17:09:42ZESD : failure mechanisms and models / 389397 Voldman, Steven H. UK : Wiley,2009eng16PSZJBLSemiconductorsIntegrated circuitsIntegrated circuitsURN:ISBN:9780470511374 (hbk.) |
spellingShingle | Semiconductors Integrated circuits Integrated circuits 389397 Voldman, Steven H. ESD : failure mechanisms and models / |
title | ESD : failure mechanisms and models / |
title_full | ESD : failure mechanisms and models / |
title_fullStr | ESD : failure mechanisms and models / |
title_full_unstemmed | ESD : failure mechanisms and models / |
title_short | ESD : failure mechanisms and models / |
title_sort | esd failure mechanisms and models |
topic | Semiconductors Integrated circuits Integrated circuits |
work_keys_str_mv | AT 389397voldmanstevenh esdfailuremechanismsandmodels |