Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method /

Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method /

PSZJBL

Bibliographic Details
Main Authors:	392095 Corl, Edwin A., Wimpfheimer, Hans
Format:
Language:	eng
Subjects:	Silicon Chemicals

Similar Items

Electronic states at the silicon-silicon dioxide interface /
by: 320772 Cheng, Y. C.
Published: (1977)

The growth mechanism in self-assembly nanostructures of silicon/silicon dioxide interface /
by: Fatima Aldaw Idrees, 1988-, et al.
Published: (2013)

Evaluation of the surface concentration of diffused layers in silicon /
by: 185978 Backenstoss, Gerhard

The growth mechanism in self-assembly nanostructures of silicon/silicon dioxide interface [electronic resource] /
by: Fatima Aldaw Idrees, 1988-
Published: (2013)

STRUCTURAL PROPERTIES OF POROUS SILICON PARTICLES FORMED BY MAGNESIOTHERMAL REDUCTION OF SILICON DIOXIDE PRODUCED FROM SILICON CONTAINING PLANTS
by: A. D. Syman, et al.
Published: (2019-06-01)

The formation, structural and optical properties of silicon nanocrystals embedded in silicon dioxide /
by: Yeong, Wai Woon, 1981-, et al.
Published: (2008)

Fabrication And Characterization Of O.5-Um Mosfet Bulk Silicon Technology On Thick Bonded Silicon-On-Insulator Substrate
by: Abdullah, Wan Fazlida Hanim
Published: (2003)

Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging
by: Saravana Kumar, et al.
Published: (2025-01-01)

MODELING AND ANALYSIS OF MOLECULAR DYNAMICS OF SILICON-SOLVENT-VINPOCETIN SYSTEMS AND SILICON-SOLVENT-VINPOCETIN DIOXIDE
by: Yu. A. Polkovnikova, et al.
Published: (2019-01-01)

The formation, structural and optical properties of silicon nanocrystals embedded in silicon dioxide [electronic resource] /
by: Yeong, Wai Woon, 1981-
Published: (2012)

CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS
by: V. А. Pilipenko, et al.
Published: (2017-12-01)

Electronic Properties of Amorphous Silicon Dioxide
by: Kastner, Marc A.
Published: (2010)

Electronic Properties of Amorphous Silicon Dioxide
by: Kastner, Marc A.
Published: (2010)

Electronic Properties of Amorphous Silicon Dioxide
by: Kastner, Marc A.
Published: (2010)

Electronic Properties of Amorphous Silicon Dioxide
by: Kastner, Marc A.
Published: (2010)

Silicones/
by: 231778 Meals, Robert N., et al.
Published: (1959)

Formation of Functional Silicon Nitride Layers by Selective Plasmochemical Etching
by: V. V. Emelyanov
Published: (2022-03-01)

The chemistry of silicon /
by: Rochow, Eugene George, 1909-
Published: (1973)

System on silicon /
by: Denyer, P. B.
Published: (1984)

Lifetime in semiconductors : an apparatus for the measurement of carrier liftmen in silicon /
by: 269176 Rose, F. W. G., et al.

Electrical discharge machining of siliconized silicon carbide using copper electrode /
by: Abdul Azeez Abdu Aliyu, 1980-, et al.
Published: (2014)

Properties of amorphous silicon
by: Institution of Electrical Engineers (Great Britain)
Published: (1989)

Silicon chemistry and applications/
by: 198204 Pearce, C. A.
Published: (1972)

Machining pockets on silicon /
by: 435234 Yu, Poh Ching
Published: (2001)

Silicon chemistry : from the atom to extended systems /
by: Jutzi, Peter, et al.
Published: (2003)

Electrical discharge machining of siliconized silicon carbide using copper electrode [electronic resource] /
by: Abdul Azeez Abdu Aliyu, 1980-
Published: (2014)

The properties of nitrogen and oxygen in silicon
by: Murphy, J, et al.
Published: (2006)

Silicones : an introduction to their chemistry and applications/
by: 222414 Freeman, G. G.
Published: (1962)

Silicon and its binary systems/
by: 222465 Berezhnoi, Anatolii Semenovich
Published: (1960)

Radio chemical analysis of silicon /
by: 269240 James, J. A.

Crystallization of polycrystalline silicon thin film by excimer laser annealing /
by: 441403 Siti Noraiza Ab. Razak, et al.
Published: (2011)

MEASUREMENT OF MICROHARDNESS OF PHOTORESIST FILMS ON SILICON BY THE SCRATCHING METHOD
by: D. I. Brinkevich, et al.
Published: (2016-06-01)

EFFECT OF SUNLIGHT ON THE ELECTRICAL CHARACTERISTICS OF THE HETEROSTRUCTURE TITANIUM DIOXIDE/SILICON
by: A. A. Kuraptsova, et al.
Published: (2019-12-01)

ASSESSMENT OF BIOLOGICAL PROPERTIES OF CONCENTRATE OF NANOSTRUCTURES BASED ON SILICON DIOXIDE
by: L. M. Sosedova, et al.
Published: (2017-07-01)

Porous silicon /
by: Feng, Zhe Chuan, et al.
Published: (1994)

Performance evaluation of a silicon nanowire transistor /
by: Choe, Yuet Sheng, 1986-, et al.
Published: (2009)

Silicon photonics /
by: Pavesi, Lorenzo, et al.
Published: (c200)

Silicon carbide /
by: 269121 Frantsevich, I. N., et al.
Published: (1970)

Electronic Properties of Intrinsic Defects in Amorphous Silicon Dioxide
by: Kastner, Marc A.
Published: (2010)

Crystallization of polycrystalline silicon thin film by excimer laser annealin [electronic resource] /
by: 441403 Siti Noraiza Ab. Razak
Published: (2011)