Yield and productivity improvement using total quality control methods in an electronic factory /
Project paper (Bachelor of Mechanical Engineering) - Universiti Teknologi Malaysia, 1995
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Skudai : UTM,
1995
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| _version_ | 1826417133768146944 |
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| author | Lee, Chai Bit |
| author_facet | Lee, Chai Bit |
| author_sort | Lee, Chai Bit |
| collection | OCEAN |
| description | Project paper (Bachelor of Mechanical Engineering) - Universiti Teknologi Malaysia, 1995 |
| first_indexed | 2024-03-05T03:41:07Z |
| format | |
| id | KOHA-OAI-TEST:303892 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-05T03:41:07Z |
| publishDate | 1995 |
| publisher | Skudai : UTM, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:3038922020-12-19T17:10:07ZYield and productivity improvement using total quality control methods in an electronic factory / Lee, Chai Bit Skudai : UTM,1995Project paper (Bachelor of Mechanical Engineering) - Universiti Teknologi Malaysia, 199522PRZSLProduction controlProduction managementIndustrial productivity |
| spellingShingle | Production control Production management Industrial productivity Lee, Chai Bit Yield and productivity improvement using total quality control methods in an electronic factory / |
| title | Yield and productivity improvement using total quality control methods in an electronic factory / |
| title_full | Yield and productivity improvement using total quality control methods in an electronic factory / |
| title_fullStr | Yield and productivity improvement using total quality control methods in an electronic factory / |
| title_full_unstemmed | Yield and productivity improvement using total quality control methods in an electronic factory / |
| title_short | Yield and productivity improvement using total quality control methods in an electronic factory / |
| title_sort | yield and productivity improvement using total quality control methods in an electronic factory |
| topic | Production control Production management Industrial productivity |
| work_keys_str_mv | AT leechaibit yieldandproductivityimprovementusingtotalqualitycontrolmethodsinanelectronicfactory |