Sample preparation and hall effect measurement for N-type and P-type silicons /

Sample preparation and hall effect measurement for N-type and P-type silicons /

Project paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2009

מידע ביבליוגרפי
Main Authors: 505569 Lai, Cing Xin, Muhammad Zaki Yaacob, Fakulti Sains
פורמט:
שפה:eng
יצא לאור: 2009
תיאור
סיכום:Project paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2009

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