Sample preparation and hall effect measurement for N-type and P-type silicons /
Project paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2009
| Main Authors: | , , |
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| Format: | |
| Language: | eng |
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2009
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| _version_ | 1826417597275439104 |
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| author | 505569 Lai, Cing Xin Muhammad Zaki Yaacob Fakulti Sains |
| author_facet | 505569 Lai, Cing Xin Muhammad Zaki Yaacob Fakulti Sains |
| author_sort | 505569 Lai, Cing Xin |
| collection | OCEAN |
| description | Project paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2009 |
| first_indexed | 2024-03-05T03:48:11Z |
| format | |
| id | KOHA-OAI-TEST:306249 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T03:48:11Z |
| publishDate | 2009 |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:3062492020-12-19T17:10:12ZSample preparation and hall effect measurement for N-type and P-type silicons / 505569 Lai, Cing Xin Muhammad Zaki Yaacob Fakulti Sains 2009engProject paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2009Includes bibliographical referencesFSL |
| spellingShingle | 505569 Lai, Cing Xin Muhammad Zaki Yaacob Fakulti Sains Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title | Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title_full | Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title_fullStr | Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title_full_unstemmed | Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title_short | Sample preparation and hall effect measurement for N-type and P-type silicons / |
| title_sort | sample preparation and hall effect measurement for n type and p type silicons |
| work_keys_str_mv | AT 505569laicingxin samplepreparationandhalleffectmeasurementforntypeandptypesilicons AT muhammadzakiyaacob samplepreparationandhalleffectmeasurementforntypeandptypesilicons AT fakultisains samplepreparationandhalleffectmeasurementforntypeandptypesilicons |