Sample preparation and hall effect measurement for N-type and P-type silicons /

Παρόμοια τεκμήρια

• Sample preparation and hall effect measurement for N-type gallium arsenide (GaAs) /
  ανά: Nor Hishamuddin Ab. Latif, 1989-, κ.ά.
  Έκδοση: (2012)
• A study of annealing effect on contact resistance of aluminium film on P-type silicon /
  ανά: 178776 Teoh, Chin Hong, κ.ά.
  Έκδοση: (2004)
• Preparation of P-N junction diode using alloy method /
  ανά: Khairul Ariffin Muhammad, 1988-, κ.ά.
  Έκδοση: (2010)
• Determination of carrier concentration of n type silicon /
  ανά: Nur Alleyna Farhana Mohd. Naim, 1986-, κ.ά.
• Studies Of The Effect Of Post Deposition Annealing To The Ceo2 Thin Film On P-Type Silicon And N-Type Silicon Carbide Substrates
  ανά: Chuah, Soo Kiet
  Έκδοση: (2011)