Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /

Thesis (PhD) - University of Lancaster, 1996

Bibliographic Details
Main Author: Abu Khairi A'ain
Format:
Published: Lancaster, Eng. : University of Lancaster, 1996
Subjects:
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author Abu Khairi A'ain
author_facet Abu Khairi A'ain
author_sort Abu Khairi A'ain
collection OCEAN
description Thesis (PhD) - University of Lancaster, 1996
first_indexed 2024-03-05T04:40:01Z
format
id KOHA-OAI-TEST:323515
institution Universiti Teknologi Malaysia - OCEAN
last_indexed 2024-03-05T04:40:01Z
publishDate 1996
publisher Lancaster, Eng. : University of Lancaster,
record_format dspace
spelling KOHA-OAI-TEST:3235152020-12-19T17:10:55ZPower supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / Abu Khairi A'ain Lancaster, Eng. : University of Lancaster,1996Thesis (PhD) - University of Lancaster, 199615PRZSLLinear integrated circuits
spellingShingle Linear integrated circuits
Abu Khairi A'ain
Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title_full Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title_fullStr Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title_full_unstemmed Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title_short Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
title_sort power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits
topic Linear integrated circuits
work_keys_str_mv AT abukhairiaain powersupplyvoltagecontroltestingtechniqueasanovelelectricalteststrategyforanalogueintegratedcircuits