Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits /
Thesis (PhD) - University of Lancaster, 1996
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Lancaster, Eng. : University of Lancaster,
1996
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author | Abu Khairi A'ain |
author_facet | Abu Khairi A'ain |
author_sort | Abu Khairi A'ain |
collection | OCEAN |
description | Thesis (PhD) - University of Lancaster, 1996 |
first_indexed | 2024-03-05T04:40:01Z |
format | |
id | KOHA-OAI-TEST:323515 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-05T04:40:01Z |
publishDate | 1996 |
publisher | Lancaster, Eng. : University of Lancaster, |
record_format | dspace |
spelling | KOHA-OAI-TEST:3235152020-12-19T17:10:55ZPower supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / Abu Khairi A'ain Lancaster, Eng. : University of Lancaster,1996Thesis (PhD) - University of Lancaster, 199615PRZSLLinear integrated circuits |
spellingShingle | Linear integrated circuits Abu Khairi A'ain Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title | Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title_full | Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title_fullStr | Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title_full_unstemmed | Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title_short | Power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits / |
title_sort | power supply voltage control testing technique as a novel electrical test strategy for analogue integrated circuits |
topic | Linear integrated circuits |
work_keys_str_mv | AT abukhairiaain powersupplyvoltagecontroltestingtechniqueasanovelelectricalteststrategyforanalogueintegratedcircuits |