The core test wrapper handbook : rationale and application of IEEE Std 1500 /

The core test wrapper handbook : rationale and application of IEEE Std 1500 /

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Bibliographic Details
Main Authors: 181132 Da Silva, Francisco, McLaurin, Teresa, Waayers, Tom
Format:
Language:eng
Published: London : Springer, 2006
Subjects:
Embedded computer systems
Systems on a chip
Integrated circuits

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