APA ציטוט

185978 Backenstoss, G. Evaluation of the surface concentration of diffused layers in silicon.

Chicago Style (17th ed.) Citation

185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.

ציטוט MLA

185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.