185978 Backenstoss, G. Evaluation of the surface concentration of diffused layers in silicon.
Chicago Style (17th ed.) Citation185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.
MLA引文185978 Backenstoss, Gerhard. Evaluation of the Surface Concentration of Diffused Layers in Silicon.
警告:這些引文格式不一定是100%准確.