Evaluation of the surface concentration of diffused layers in silicon /

Registros relacionados

• Performance evaluation of a silicon nanowire transistor /
  por: Choe, Yuet Sheng, 1986-, et al.
  Publicado em: (2009)
• Performance evaluation of a silicon nanowire transistor [electronic resource] /
  por: Choe, Yuet Sheng, 1986-
  Publicado em: (2009)
• Silicones/
  por: 231778 Meals, Robert N., et al.
  Publicado em: (1959)
• Thickness measurement of silicon dioxide layers by ultraviolet-visible interference method /
  por: 392095 Corl, Edwin A., et al.
• The chemistry of silicon /
  por: Rochow, Eugene George, 1909-
  Publicado em: (1973)