$X-ray diffraction studies on silicon nanostructure thin films : (review paper) /$

X-ray diffraction studies on silicon nanostructure thin films : (review paper) /

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Bibliographic Details
Main Authors:	445636 Yussof Wahab, Magentharau Adin Navina, Mohd. Nor Yusof, Annual Fundamental Science Seminar (2005 : Johor)
Format:
Language:	eng
Published:	Skudai : Universiti Teknologi Malaysia, 2005
Subjects:	X-rays

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