Guide for the statistical analysis of thermal life test data /
PSZJBL
Main Author: | |
---|---|
Format: | |
Subjects: |
_version_ | 1826424104244215808 |
---|---|
author | 8595 Institute of Electrical and Electronics Engineers |
author_facet | 8595 Institute of Electrical and Electronics Engineers |
author_sort | 8595 Institute of Electrical and Electronics Engineers |
collection | OCEAN |
description | PSZJBL |
first_indexed | 2024-03-05T05:26:03Z |
format | |
id | KOHA-OAI-TEST:338811 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-05T05:26:03Z |
record_format | dspace |
spelling | KOHA-OAI-TEST:3388112020-12-19T17:11:29ZGuide for the statistical analysis of thermal life test data / 8595 Institute of Electrical and Electronics Engineers PSZJBLLife tests |
spellingShingle | Life tests 8595 Institute of Electrical and Electronics Engineers Guide for the statistical analysis of thermal life test data / |
title | Guide for the statistical analysis of thermal life test data / |
title_full | Guide for the statistical analysis of thermal life test data / |
title_fullStr | Guide for the statistical analysis of thermal life test data / |
title_full_unstemmed | Guide for the statistical analysis of thermal life test data / |
title_short | Guide for the statistical analysis of thermal life test data / |
title_sort | guide for the statistical analysis of thermal life test data |
topic | Life tests |
work_keys_str_mv | AT 8595instituteofelectricalandelectronicsengineers guideforthestatisticalanalysisofthermallifetestdata |