LSI/VLSI testability design /
Main Author: | 438910 Tsui, Frank F. |
---|---|
Format: | |
Published: |
New York : McGraw-Hill,
1986
|
Subjects: |
Similar Items
-
VLSI test principles and architectures : design for testability /
by: Wang, Laung-Terng, et al.
Published: (2006) -
Advanced VLSI Design and Testability Issues /
by: Tripathi, Suma Lata, editor., et al.
Published: (2020) -
Digital systems testing and testable design /
by: 190964 Abramovici, Miron, et al.
Published: (1990) -
Digital design with standard MSI and LSI /
by: 371785 Blakeslee, Thomas R.
Published: (1975) -
Design and test techniques for VLSI and WSI circuits /
by: Massara, R. E.
Published: (1989)