Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point /
IEEE National Symposium on Microelectronics, 1997, UKM, Bangi :32-36
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| _version_ | 1826428983578722304 |
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| author | Abu Khairi A'ain |
| author_facet | Abu Khairi A'ain |
| author_sort | Abu Khairi A'ain |
| collection | OCEAN |
| description | IEEE National Symposium on Microelectronics, 1997, UKM, Bangi :32-36 |
| first_indexed | 2024-03-05T06:38:44Z |
| format | |
| id | KOHA-OAI-TEST:363060 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-05T06:38:44Z |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:3630602020-12-19T17:12:36ZTesting analogue circuits by power supply voltage control testing technique : an analysis at bias point / Abu Khairi A'ain IEEE National Symposium on Microelectronics, 1997, UKM, Bangi :32-3615PSZJBLLinear integrated circuits |
| spellingShingle | Linear integrated circuits Abu Khairi A'ain Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title | Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title_full | Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title_fullStr | Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title_full_unstemmed | Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title_short | Testing analogue circuits by power supply voltage control testing technique : an analysis at bias point / |
| title_sort | testing analogue circuits by power supply voltage control testing technique an analysis at bias point |
| topic | Linear integrated circuits |
| work_keys_str_mv | AT abukhairiaain testinganaloguecircuitsbypowersupplyvoltagecontroltestingtechniqueananalysisatbiaspoint |