Semiconductor material and device characterization /
40
| Main Author: | |
|---|---|
| Format: | |
| Language: | eng |
| Published: |
Hoboken, NJ : John Wiley & Sons,
2006
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| Subjects: |
| _version_ | 1796720429629440000 |
|---|---|
| author | Schroder, Dieter K |
| author_facet | Schroder, Dieter K |
| author_sort | Schroder, Dieter K |
| collection | OCEAN |
| description | 40 |
| first_indexed | 2024-03-05T06:47:14Z |
| format | |
| id | KOHA-OAI-TEST:365873 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T06:47:14Z |
| publishDate | 2006 |
| publisher | Hoboken, NJ : John Wiley & Sons, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:3658732020-12-19T17:12:42ZSemiconductor material and device characterization / Schroder, Dieter K Hoboken, NJ : John Wiley & Sons,2006eng4012PSZJBLSemiconductorsSemiconductorsURN:ISBN:0471739065 (hbk.) |
| spellingShingle | Semiconductors Semiconductors Schroder, Dieter K Semiconductor material and device characterization / |
| title | Semiconductor material and device characterization / |
| title_full | Semiconductor material and device characterization / |
| title_fullStr | Semiconductor material and device characterization / |
| title_full_unstemmed | Semiconductor material and device characterization / |
| title_short | Semiconductor material and device characterization / |
| title_sort | semiconductor material and device characterization |
| topic | Semiconductors Semiconductors |
| work_keys_str_mv | AT schroderdieterk semiconductormaterialanddevicecharacterization |