Matching properties of deep sub-micron MOS transistors /

Matching properties of deep sub-micron MOS transistors /

16

Bibliographic Details
Main Authors:	229989 Croon, Jeroen A., Sansen, Willy M. C., Maes, H. E.
Format:
Language:	eng
Published:	New York, NY : Springer, 2005
Subjects:	Metal oxide semiconductor field-effect transistors

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