Scanning probe microscopy : atomic scale engineering by forces and currents /
42
Autors principals: | , |
---|---|
Format: | |
Idioma: | eng |
Publicat: |
New York, NY : Springer Science+Business,
2006
|
Matèries: |
42
Autors principals: | , |
---|---|
Format: | |
Idioma: | eng |
Publicat: |
New York, NY : Springer Science+Business,
2006
|
Matèries: |