Scanning probe microscopy : atomic scale engineering by forces and currents /
42
Main Authors: | , |
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Format: | |
Sprog: | eng |
Udgivet: |
New York, NY : Springer Science+Business,
2006
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Fag: |
42
Main Authors: | , |
---|---|
Format: | |
Sprog: | eng |
Udgivet: |
New York, NY : Springer Science+Business,
2006
|
Fag: |