Scanning probe microscopy : atomic scale engineering by forces and currents /

Scanning probe microscopy : atomic scale engineering by forces and currents /

42

Detalles Bibliográficos
Autores principales: Foster, A. (Adam Stuart), 1975-, Hofer, Werner, 1960-
Formato:
Lenguaje:eng
Publicado: New York, NY : Springer Science+Business, 2006
Materias:
Scanning probe microscopy

Ejemplares similares