Scanning probe microscopy : atomic scale engineering by forces and currents /

Scanning probe microscopy : atomic scale engineering by forces and currents /

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Détails bibliographiques
Auteurs principaux: Foster, A. (Adam Stuart), 1975-, Hofer, Werner, 1960-
Format:
Langue:eng
Publié: New York, NY : Springer Science+Business, 2006
Sujets:
Scanning probe microscopy

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