Scanning probe microscopy : atomic scale engineering by forces and currents /

Scanning probe microscopy : atomic scale engineering by forces and currents /

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Detalles Bibliográficos
Main Authors: Foster, A. (Adam Stuart), 1975-, Hofer, Werner, 1960-
Formato:
Idioma:eng
Publicado: New York, NY : Springer Science+Business, 2006
Subjects:
Scanning probe microscopy

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