Scanning probe microscopy : atomic scale engineering by forces and currents /
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मुख्य लेखकों: | , |
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स्वरूप: | |
भाषा: | eng |
प्रकाशित: |
New York, NY : Springer Science+Business,
2006
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विषय: |
42
मुख्य लेखकों: | , |
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स्वरूप: | |
भाषा: | eng |
प्रकाशित: |
New York, NY : Springer Science+Business,
2006
|
विषय: |