Nanotechnology and nanoelectronics : materials, devices,measurement techniques /
18
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Format: | |
Language: | eng |
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New York, NY : Springer,
2005
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_version_ | 1826430329894731776 |
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author | Fahrner, W. R. (Wolfgang R.) |
author_facet | Fahrner, W. R. (Wolfgang R.) |
author_sort | Fahrner, W. R. (Wolfgang R.) |
collection | OCEAN |
description | 18 |
first_indexed | 2024-03-05T06:58:50Z |
format | |
id | KOHA-OAI-TEST:369754 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T06:58:50Z |
publishDate | 2005 |
publisher | New York, NY : Springer, |
record_format | dspace |
spelling | KOHA-OAI-TEST:3697542020-12-19T17:12:51ZNanotechnology and nanoelectronics : materials, devices,measurement techniques / Fahrner, W. R. (Wolfgang R.) New York, NY : Springer,2005eng1805PSZJBLNanotechnologyURN:ISBN:3540224521 (hbk.) |
spellingShingle | Nanotechnology Fahrner, W. R. (Wolfgang R.) Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title | Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title_full | Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title_fullStr | Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title_full_unstemmed | Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title_short | Nanotechnology and nanoelectronics : materials, devices,measurement techniques / |
title_sort | nanotechnology and nanoelectronics materials devices measurement techniques |
topic | Nanotechnology |
work_keys_str_mv | AT fahrnerwrwolfgangr nanotechnologyandnanoelectronicsmaterialsdevicesmeasurementtechniques |