Proceedings for 7th Asia Pacific Electron Microscopy Conference, 26-30 June 2000, Singapore International Convention & Exibition Centre, Suntec City, Singapore : perspective imaging

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Opis bibliograficzny
1. autor: Asia Pacific Electron Microscopy Conference (7th : 2000 : Singapore)
Format:
Wydane: Skudai : Universiti Teknologi Malaysia, 2000
Hasła przedmiotowe: