Design-for-test using scan path technique /

Project Paper (Bachelor of Electrical Engineering (Electronic)) - Universiti Teknologi Malaysia, 2001

Detalhes bibliográficos
Autor principal:	374163 Wang, Wee Ming
Formato:
Idioma:	eng
Publicado em:	Skudai : Universiti Teknologi Malaysia, 2001
Assuntos:	Digital integrated circuits

Design-for-test using scan path technique / por 374163 Wang, Wee Ming

Publicado em 2001