Design for test by using scan path technique / [disket]
Project Paper (Bachelor of Engineering (Electrical - Electronic)) - Universiti Teknologi Malaysia, 2001
| Päätekijä: | |
|---|---|
| Aineistotyyppi: | |
| Kieli: | eng |
| Julkaistu: |
Skudai : Universiti Teknologi Malaysia,
2001
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| Aiheet: |
| _version_ | 1826437532484632576 |
|---|---|
| author | 374322 Tiong, Sang Hock |
| author_facet | 374322 Tiong, Sang Hock |
| author_sort | 374322 Tiong, Sang Hock |
| collection | OCEAN |
| description | Project Paper (Bachelor of Engineering (Electrical - Electronic)) - Universiti Teknologi Malaysia, 2001 |
| first_indexed | 2024-03-05T08:46:50Z |
| format | |
| id | KOHA-OAI-TEST:405779 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T08:46:50Z |
| publishDate | 2001 |
| publisher | Skudai : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4057792020-12-19T17:14:09ZDesign for test by using scan path technique / [disket] 374322 Tiong, Sang Hock Skudai : Universiti Teknologi Malaysia,2001engProject Paper (Bachelor of Engineering (Electrical - Electronic)) - Universiti Teknologi Malaysia, 200116PSZJBLDigital integrated circuits |
| spellingShingle | Digital integrated circuits 374322 Tiong, Sang Hock Design for test by using scan path technique / [disket] |
| title | Design for test by using scan path technique / [disket] |
| title_full | Design for test by using scan path technique / [disket] |
| title_fullStr | Design for test by using scan path technique / [disket] |
| title_full_unstemmed | Design for test by using scan path technique / [disket] |
| title_short | Design for test by using scan path technique / [disket] |
| title_sort | design for test by using scan path technique disket |
| topic | Digital integrated circuits |
| work_keys_str_mv | AT 374322tiongsanghock designfortestbyusingscanpathtechniquedisket |