Design for test by using scan path technique / [disket]

Design for test by using scan path technique / [disket]

Project Paper (Bachelor of Engineering (Electrical - Electronic)) - Universiti Teknologi Malaysia, 2001

Bibliografiske detaljer
Hovedforfatter:	374322 Tiong, Sang Hock
Format:
Sprog:	eng
Udgivet:	Skudai : Universiti Teknologi Malaysia, 2001
Fag:	Digital integrated circuits

Lignende værker

Design for test by using scan path technique /
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Udgivet: (2001)

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Design-for-test using scan path technique /
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IC test based on scan cell /
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Built-in self-test method at register transfer level design for finite impulse response filter, infinite impulse response filter and greatest common divisor calculator [electronic resource] /
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af: Short Course on Design, Fabrication and testing of Integrated Circuits (1989 : Bangi, Selangor D E)
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VLSI design of shortest path processor using MIMOS 0.35um cell library - design II /
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