8-Bit X-Bit multiplier with testability features [electronic resource] /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2007

Bibliographic Details
Main Authors: 260983 Wong, Yin Yin, Fakulti Kejuruteraan Elektrik
Format:
Published: 2007
Subjects:
_version_ 1796729048315985920
author 260983 Wong, Yin Yin
Fakulti Kejuruteraan Elektrik
author_facet 260983 Wong, Yin Yin
Fakulti Kejuruteraan Elektrik
author_sort 260983 Wong, Yin Yin
collection OCEAN
description Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2007
first_indexed 2024-03-05T08:51:11Z
format
id KOHA-OAI-TEST:407205
institution Universiti Teknologi Malaysia - OCEAN
last_indexed 2024-03-05T08:51:11Z
publishDate 2007
record_format dspace
spelling KOHA-OAI-TEST:4072052020-12-19T17:14:12Z8-Bit X-Bit multiplier with testability features [electronic resource] / 260983 Wong, Yin Yin Fakulti Kejuruteraan Elektrik 2007Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2007Includes bibliographical referencesPSZJBLSmart cardsElectronic circuit design
spellingShingle Smart cards
Electronic circuit design
260983 Wong, Yin Yin
Fakulti Kejuruteraan Elektrik
8-Bit X-Bit multiplier with testability features [electronic resource] /
title 8-Bit X-Bit multiplier with testability features [electronic resource] /
title_full 8-Bit X-Bit multiplier with testability features [electronic resource] /
title_fullStr 8-Bit X-Bit multiplier with testability features [electronic resource] /
title_full_unstemmed 8-Bit X-Bit multiplier with testability features [electronic resource] /
title_short 8-Bit X-Bit multiplier with testability features [electronic resource] /
title_sort 8 bit x bit multiplier with testability features electronic resource
topic Smart cards
Electronic circuit design
work_keys_str_mv AT 260983wongyinyin 8bitxbitmultiplierwithtestabilityfeatureselectronicresource
AT fakultikejuruteraanelektrik 8bitxbitmultiplierwithtestabilityfeatureselectronicresource