Built-in self test for phase-locked loop [electronic resource] /

Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2008

Bibliographic Details
Main Authors: 391738 Goh, Alvin Shing Chye, Ooi, Chia Yee
Format:
Language:eng
Published: Skudai : Universiti Teknologi Malaysia, 2008
Subjects:
_version_ 1826438029339787264
author 391738 Goh, Alvin Shing Chye
Ooi, Chia Yee
author_facet 391738 Goh, Alvin Shing Chye
Ooi, Chia Yee
author_sort 391738 Goh, Alvin Shing Chye
collection OCEAN
description Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2008
first_indexed 2024-03-05T08:54:17Z
format
id KOHA-OAI-TEST:408228
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T08:54:17Z
publishDate 2008
publisher Skudai : Universiti Teknologi Malaysia,
record_format dspace
spelling KOHA-OAI-TEST:4082282020-12-19T17:14:15ZBuilt-in self test for phase-locked loop [electronic resource] / 391738 Goh, Alvin Shing Chye Ooi, Chia Yee Skudai : Universiti Teknologi Malaysia,2008engThesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 200816PSZJBLPhase-locked loops
spellingShingle Phase-locked loops
391738 Goh, Alvin Shing Chye
Ooi, Chia Yee
Built-in self test for phase-locked loop [electronic resource] /
title Built-in self test for phase-locked loop [electronic resource] /
title_full Built-in self test for phase-locked loop [electronic resource] /
title_fullStr Built-in self test for phase-locked loop [electronic resource] /
title_full_unstemmed Built-in self test for phase-locked loop [electronic resource] /
title_short Built-in self test for phase-locked loop [electronic resource] /
title_sort built in self test for phase locked loop electronic resource
topic Phase-locked loops
work_keys_str_mv AT 391738gohalvinshingchye builtinselftestforphaselockedloopelectronicresource
AT ooichiayee builtinselftestforphaselockedloopelectronicresource