Built-in self test for phase-locked loop [electronic resource] /

Built-in self test for phase-locked loop [electronic resource] /

Thesis (Sarjana Kejuruteraan (Komputer dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2008

Bibliographic Details
Main Authors:	391738 Goh, Alvin Shing Chye, Ooi, Chia Yee
Format:
Language:	eng
Published:	Skudai : Universiti Teknologi Malaysia, 2008
Subjects:	Phase-locked loops

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